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Communication Dans Un Congrès Année : 2017

Test and reliability in approximate computing

Résumé

This paper presents an overview of approximate computing, from the perspective of a test/reliability engineer. The focus of this paper is not on the actual conception of approximate hardware/software/algorithms, but on how specific methods for test and reliability can be used to improve the characteristics (power consumption, area, life expectancy, precision) of approximate computing.
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Dates et versions

hal-01702768 , version 1 (07-02-2018)

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Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Elena Ioana Vatajelu. Test and reliability in approximate computing. IMSTW: International Mixed-Signal Testing Workshop, Jul 2017, Thessaloniki, Greece. ⟨10.1109/IMS3TW.2017.7995210⟩. ⟨hal-01702768⟩
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