In this article, we present a study on the measurement of the electromagnetic radiation of equipments in the near field. The measurements of these disturbances are needed either to verify accordance with the standards, or to analyze the electromagnetic compatibility (EMC) behavior of a device. To characterize the radiated emission level of a device, the use of a near field bench is a useful tool. For this reason, the first part of this article is dedicated to the implementation of a near field bench and to the application of a magnetic probe calibration method. These will lead to a quantitative mapping of radiated magnetic field. The second part of this article is devoted to a method for retrieving a radiation model able to characterize disturbance sources. The model will be used to predict the shielding effectiveness of electronics enclosures.