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Article Dans Une Revue Vacuum Année : 2017

Reaction paths of Ni rich phases: Effect of Ni thickness

Résumé

The kinetics of growth and consumption of Ni-rich phases is determined from in situ X-ray diffraction measurements performed during isothermal annealing. The results show that the life time of theta-Ni2Si depends on the initial Ni thickness. A slow kinetic of consumption of theta-Ni2Si is observed during the reaction of 50 nm Ni with Si substrate, while a fast rate of consumption of theta-Ni2Si is observed when theta-Ni2Si is a transient phase. A qualitative model has been proposed to explain the obtained results. (C) 2017 Elsevier Ltd. All rights reserved.
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hal-01694210 , version 1 (26-01-2018)

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G. Tellouche, A. Derafa, K. Hoummada, Dominique Mangelinck. Reaction paths of Ni rich phases: Effect of Ni thickness. Vacuum, 2017, 141, pp.259-264. ⟨10.1016/j.vacuum.2017.03.019⟩. ⟨hal-01694210⟩
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