Optical-based probe for real time assessment of RF electrical field during MRI exam - Archive ouverte HAL
Communication Dans Un Congrès Année : 2017

Optical-based probe for real time assessment of RF electrical field during MRI exam

Résumé

During MRI exam, Specific Absorption Rate (SAR) is essential to be controlled and can be evaluated by measuring either indirectly for instance the rise in temperature or directly the radiofrequency induced electrical E-field. In the current study, we proposed an optical probe based on the Pockels effect for subcentimeter resolution measurements of the E-field without altering the surrounding media. Measurements were performed at 4.7 T and 3.0 T. Results show that the probe has an excellent linear response and allow a real time estimate of the three components of the E-field produced during MRI examination.

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Dates et versions

hal-01693604 , version 1 (19-06-2018)

Identifiants

  • HAL Id : hal-01693604 , version 1

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Isabelle Saniour, Gwenaël Gaborit, Lionel Duvillaret, Anne-Laure Perrier, Olivier Beuf. Optical-based probe for real time assessment of RF electrical field during MRI exam. 25th annual meeting & exhibition ISMRM, Apr 2017, Honolulu, United States. ⟨hal-01693604⟩
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