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Communication Dans Un Congrès Année : 2013

Experimental approach to predict the reliability of electronic component

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hal-01689711 , version 1 (22-01-2018)

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Narayanaswami Ranganathan, Ze Ma, Florent Chalon, René Leroy, Wafaa Rmili. Experimental approach to predict the reliability of electronic component. JIP 13th International Spring Meeting, Fatigue behaviour: from speciment to structure, May 2013, Paris, France. ⟨hal-01689711⟩
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