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Article Dans Une Revue Applied Physics Letters Année : 2010

Influence of edges on the exchange bias properties of ferromagnetic/antiferromagnetic nanodots

Résumé

For ferromagnetic F/antiferromagnetic AF nanodots contributions of AF spins to exchange bias is discussed. The relative weights of AF entities located at the dot edges, at the F/AF interface and in the AF grains were obtained by comparing the blocking temperature distribution of an array of nanodots with that of corresponding continuous film. Due to grain cutting, the grain size distribution is altered. We show here that the dot edges constitute additional locations for the formation of spin-glasslike AF regions at the F/AF interface. The result of patterning is thus twofold and weakens the dot ability to resist thermally activated magnetization reversal.
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Dates et versions

hal-01683835 , version 1 (23-05-2019)

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Vincent Baltz, G. Gaudin, P. Somani, B. Dieny. Influence of edges on the exchange bias properties of ferromagnetic/antiferromagnetic nanodots. Applied Physics Letters, 2010, 96, pp.262505. ⟨10.1063/1.3449123⟩. ⟨hal-01683835⟩
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