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Article Dans Une Revue IEEE Transactions on Device and Materials Reliability Année : 2017

Reliability-Aware Circuit Design Methodology for Beyond-5G Communication Systems

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hal-01670929 , version 1 (21-12-2017)

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Chhandak Mukherjee, Bertrand Ardouin, Jean-Yves Dupuy, Virginie Nodjiadjim, Muriel Riet, et al.. Reliability-Aware Circuit Design Methodology for Beyond-5G Communication Systems. IEEE Transactions on Device and Materials Reliability, 2017, 17 (3), pp.490 - 506. ⟨10.1109/TDMR.2017.2710303⟩. ⟨hal-01670929⟩
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