Supercapacitor ageing at constant temperature and constant voltage and thermal shock

H. Gualous; R. Gallay; G. Alcicek; B. Tala-Ighil; A. Oukaour; B. Boudart; Ph. Makany

doi:10.1016/j.microrel.2010.07.144

Journal Articles Microelectronics Reliability Year : 2010

Supercapacitor ageing at constant temperature and constant voltage and thermal shock

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H. Gualous

Function : Author

R. Gallay

Function : Author

G. Alcicek

Function : Author

Laboratoire de recherche en Electronique, Electrotechnique et Systèmes

B. Tala-Ighil

Function : Author

Laboratoire Universitaire des Sciences Appliquées de Cherbourg

A. Oukaour

Function : Author

Laboratoire Universitaire des Sciences Appliquées de Cherbourg

B. Boudart

Function : Author
PersonId : 16148
IdHAL : bertrand-boudart
IdRef : 060260092

Laboratoire Universitaire des Sciences Appliquées de Cherbourg

Ph. Makany

Function : Author

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Engineering Sciences [physics] Electric power

Bertrand BOUDART : Connect in order to contact the contributor

https://hal.science/hal-01646990

Submitted on : Friday, November 24, 2017-9:09:50 AM

Last modification on : Wednesday, August 2, 2023-4:40:25 PM

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hal-01646990 , version 1 (24-11-2017)

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HAL Id : hal-01646990 , version 1
DOI : 10.1016/j.microrel.2010.07.144

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H. Gualous, R. Gallay, G. Alcicek, B. Tala-Ighil, A. Oukaour, et al.. Supercapacitor ageing at constant temperature and constant voltage and thermal shock. Microelectronics Reliability, 2010, 50 (9-11), pp.1783 - 1788. ⟨10.1016/j.microrel.2010.07.144⟩. ⟨hal-01646990⟩

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Supercapacitor ageing at constant temperature and constant voltage and thermal shock

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