Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL
S. Buchner
(1)
,
Nicolas Jean-Henri Roche
(2, 3)
,
J. Warner
(1)
,
D. Mcmorrow
(1)
,
F. Miller
(4)
,
S. Morand
(4)
,
V. Pouget
(5)
,
C. Larue
(5)
,
V. Ferlet-Cavrois
(6)
,
F. El Mamouni
(7)
,
Heikki Kettunen
(8)
,
P. C. Adell
(9)
,
G. Allen
(9)
,
David Aveline
(9)
1
NRL -
Naval Research Laboratory
2 IES - Institut d’Electronique et des Systèmes
3 RADIAC - Radiations et composants
4 EADS - Defence & Security
5 IMS - Laboratoire de l'intégration, du matériau au système
6 ESA - ESA (Eurpean Space Agency) -Noordwijk
7 Vanderbilt University [Nashville]
8 JYU - University of Jyväskylä
9 JPL - Jet Propulsion Laboratory
2 IES - Institut d’Electronique et des Systèmes
3 RADIAC - Radiations et composants
4 EADS - Defence & Security
5 IMS - Laboratoire de l'intégration, du matériau au système
6 ESA - ESA (Eurpean Space Agency) -Noordwijk
7 Vanderbilt University [Nashville]
8 JYU - University of Jyväskylä
9 JPL - Jet Propulsion Laboratory
V. Pouget
- Fonction : Auteur
- PersonId : 21573
- IdHAL : vincent-pouget
- ORCID : 0000-0001-6126-6708
- IdRef : 060649313
Résumé
Single event transients generated in a large-area photodiode were compared using a variety of different pulsed laser systems. Differences in transient amplitudes and charge collection are attributed to the different laser characteristics.