X-Ray Diffraction and Raman Spectroscopy Study of Strain in Graphene Films Grown on 6H-SiC(0001) Using Propane-Hydrogen-Argon CVD - Archive ouverte HAL Access content directly
Conference Papers Year : 2013

X-Ray Diffraction and Raman Spectroscopy Study of Strain in Graphene Films Grown on 6H-SiC(0001) Using Propane-Hydrogen-Argon CVD

Antoine Tiberj
Jean Roch Huntzinger
Olivia Mauguin
Marc Zielinski
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hal-01617115 , version 1 (16-10-2017)

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Adrien Michon, Ludovic Largeau, Antoine Tiberj, Jean Roch Huntzinger, Olivia Mauguin, et al.. X-Ray Diffraction and Raman Spectroscopy Study of Strain in Graphene Films Grown on 6H-SiC(0001) Using Propane-Hydrogen-Argon CVD. Silicon Carbide and Related Materials 2012, Sep 2012, Saint-Petersburg, Russia. pp.117 - 120, ⟨10.4028/www.scientific.net/MSF.740-742.117⟩. ⟨hal-01617115⟩
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