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Article Dans Une Revue Electronics Letters Année : 1998

BiCMOS thermal sensor circuit for built-in test purposes

Résumé

New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present a new built-in IC-surface differential thermal sensor. The sensor, analysis, implementation on a BiCMOS specific integrated circuit, and experimental measurements show the viability of temperature sensing for testing purposes.
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Dates et versions

hal-01550270 , version 1 (29-06-2017)

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J. Altet, A. Rubio, S. Dilhaire, Emmanuel Schaub, W. Claeys. BiCMOS thermal sensor circuit for built-in test purposes. Electronics Letters, 1998, 34 (13), pp.1307-1309. ⟨10.1049/el:19980947⟩. ⟨hal-01550270⟩

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