Three-dimensional strain mapping using in situ X-ray synchrotron microtomography - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Strain Analysis for Engineering Design Année : 2011

Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

Résumé

Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.
Fichier principal
Vignette du fichier
Three-dimensional strain mapping using in situ X-ray synchrotron microtomography.pdf (1.34 Mo) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-01538234 , version 1 (29-04-2022)

Identifiants

Citer

H Toda, E Maire, Yoshimitsu Aoki, M Kobayashi. Three-dimensional strain mapping using in situ X-ray synchrotron microtomography. Journal of Strain Analysis for Engineering Design, 2011, 46 (7), pp.549-561. ⟨10.1177/0309324711408975⟩. ⟨hal-01538234⟩
27 Consultations
13 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More