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Communication Dans Un Congrès Année : 2016

Paradigm shift in the level of Quality and Reliability in semiconductors to a level smaller than 10ppb

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hal-01513849 , version 1 (25-04-2017)

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Lorena Anghel. Paradigm shift in the level of Quality and Reliability in semiconductors to a level smaller than 10ppb. Automotive Reliability and Test Workshop, Nov 2016, Fort Worth, United States. ⟨hal-01513849⟩

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