X-ray photoelectron spectroscopy for wheat powders: measurement of surface chemical composition - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Agricultural and Food Chemistry Année : 2011

X-ray photoelectron spectroscopy for wheat powders: measurement of surface chemical composition

Résumé

The functional properties of wheat powders depend largely on the surface characteristics of their particles. X-ray photoelectron spectroscopy (XPS) has been considered to investigate the surface composition of wheat powders. The objective of the present study is to evaluate the ability of XPS to discriminate wheat components and to calculate the surface composition of wheat powders. First, XPS surveys for the main wheat isolated components (starch, proteins, arabinoxylans, and lipids) were determined. XPS results demonstrate that it is able to distinguish wheat proteins, polysaccharides, and lipids, but it is not able to distinguish starch and arabinoxylan because of their similarity in chemical structure. The XPS analyses of simple reconstituted wheat flours based on two components (starch and protein) or three components (by adding arabinoxylan) demonstrated the ability of XIS to measure the surface composition of the wheat flours. The surface composition of native wheat flour demonstrated an overrepresentation of protein (54%) and lipids (44%) and an underrepresentation of starch (2%) compared to the bulk composition. Results are discussed with regard to difficulties in discriminating arabinoxylans components.
Fichier non déposé

Dates et versions

hal-01506083 , version 1 (12-04-2017)

Identifiants

Citer

Moustafa Saad, Claire Gaiani, Martine Mullet, Joël Scher, Bernard Cuq. X-ray photoelectron spectroscopy for wheat powders: measurement of surface chemical composition. Journal of Agricultural and Food Chemistry, 2011, 59 (5), pp.1527-1540. ⟨10.1021/jf102315h⟩. ⟨hal-01506083⟩
200 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More