Imaging by Atomic Force Microscopy of the properties difference of the layers covering the facets created during SIMS analysis - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Surface Science Année : 2014

Imaging by Atomic Force Microscopy of the properties difference of the layers covering the facets created during SIMS analysis

B. Fares
  • Fonction : Auteur
Brice Gautier
David Albertini
A. Mzerd
  • Fonction : Auteur
M. Loghmarti
  • Fonction : Auteur

Résumé

no abstract
Fichier non déposé

Dates et versions

hal-01490337 , version 1 (15-03-2017)

Identifiants

  • HAL Id : hal-01490337 , version 1

Citer

B. Fares, Brice Gautier, David Albertini, A. Mzerd, M. Loghmarti. Imaging by Atomic Force Microscopy of the properties difference of the layers covering the facets created during SIMS analysis. Applied Surface Science, 2014, 308, pp.24-30. ⟨hal-01490337⟩
75 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More