Study of workload impact on BTI HCI induced aging of digital circuits - Archive ouverte HAL Access content directly
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hal-01474800 , version 1 (23-02-2017)

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A. Sivadasan, F. Cacho, A. Benhassain, V. Huard, Lorena Anghel. Study of workload impact on BTI HCI induced aging of digital circuits. Design Automation and Test in Europe (DATE'16), Mar 2016, Dresden, Germany. ⟨hal-01474800⟩

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