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https://hal.science/hal-01474800
Submitted on : Thursday, February 23, 2017-10:53:27 AM
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A. Sivadasan, F. Cacho, A. Benhassain, V. Huard, Lorena Anghel. Study of workload impact on BTI HCI induced aging of digital circuits. Design Automation and Test in Europe (DATE'16), Mar 2016, Dresden, Germany. ⟨hal-01474800⟩
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