Conference Papers
Year :
Lucie Torella : Connect in order to contact the contributor
https://hal.science/hal-01474799
Submitted on : Thursday, February 23, 2017-10:52:43 AM
Last modification on : Friday, March 24, 2023-2:53:03 PM
Dates and versions
Licence
Identifiers
- HAL Id : hal-01474799 , version 1
Cite
A. Sivadasan, F. Cacho, A. Benhassain, V. Huard, Lorena Anghel. Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Mar 2016, Dresden, Germany. ⟨hal-01474799⟩
105
View
0
Download