Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis - Archive ouverte HAL Access content directly
Conference Papers Year :
Not file

Dates and versions

hal-01474799 , version 1 (23-02-2017)

Licence

Attribution - NonCommercial - CC BY 4.0

Identifiers

  • HAL Id : hal-01474799 , version 1

Cite

A. Sivadasan, F. Cacho, A. Benhassain, V. Huard, Lorena Anghel. Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Mar 2016, Dresden, Germany. ⟨hal-01474799⟩

Collections

UGA CNRS TIMA
105 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More