Robustness of Timing in-situ Monitors for AVS Management - Archive ouverte HAL Access content directly
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hal-01474794 , version 1 (23-02-2017)

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  • HAL Id : hal-01474794 , version 1

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A. Benhassain, F. Cacho, V. Huard, S. Mhira, Lorena Anghel, et al.. Robustness of Timing in-situ Monitors for AVS Management. IEEE International Reliability Physics Semiconductor (IRPS'16), Apr 2016, Passadena, United States. ⟨hal-01474794⟩

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