Grazing incidence x-ray scattering investigation of Si surface patterned with buried dislocation networks - Archive ouverte HAL
Article Dans Une Revue Applied Physics Letters Année : 2003

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hal-01442883 , version 1 (21-01-2017)

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F. Leroy, J. Eymery, D. Buttard, G. Renaud, R. Lazzari, et al.. Grazing incidence x-ray scattering investigation of Si surface patterned with buried dislocation networks. Applied Physics Letters, 2003, 82 (16), pp.2598 - 2600. ⟨10.1063/1.1568545⟩. ⟨hal-01442883⟩
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