Angular resolved electron energy loss spectroscopy in hexagonal boron nitride
Résumé
Core and low energy electronic excitations have been studied in hexagonal boron nitride. Electron energy loss spectra have been measured using an electron microscope equipped with a monochromator and an in-column filter. Energy filtered diffraction patterns have been recorded and provide us with a global view of anisotropic effects in reciprocal space. From combined angular and energy resolved measurements, we analyze the symmetry of the losses as a function of the energy transferred to the material. As an example we show how easily the core loss spectra at the K edges of boron and nitrogen can be measured and imaged. Low losses associated to interband and/or plasmon excitations are also measured and discussed from ab initio calculations. This electronic inelastic scattering technique is shown to provide results comparable to those obtained from non resonant X-ray inelastic scattering. Both techniques are complementary: X-ray scattering is more accurate at large q wave vector whereas electron spectroscopy is more accurate at low q and is an attractive tool to study excitonic effects, which are inaccessible by optical techniques. Furthermore the method is fast and local, at a nanoscale level, and is very promising for studying two dimensional materials and related heterostructures.
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