Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ TEM biasing

A dedicated transmission electron microscope sample holder has been used to study in situ the cold-field emission process of carbon cone nanotips (CCnTs). We show that when using a CCnT instead of a Au plate-anode, the standard deviation of the emission current noise can be decreased from the 10 nA range to the 1 nA range under vacuum conditions of 10−5 Pa. This shows the strong influence of the anode on the cold-field emission current noise.

Domaines

Physique [physics]

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150409 Manuscript, de Knoop et al-1.pdf (2.16 Mo)

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https://hal.science/hal-01430586

Soumis le : lundi 12 février 2018-15:31:59

Dernière modification le : mercredi 24 avril 2024-11:28:54

Archivage à long terme le : mardi 8 mai 2018-02:26:59

Dates et versions

hal-01430586 , version 1 (12-02-2018)

hal-01430586 , version 2 (23-02-2018)

Identifiants

HAL Id : hal-01430586 , version 1
DOI : 10.1063/1.4923245

Citer

Ludvig de Knoop, Christophe Gatel, Florent Houdellier, Marc Monthioux, Aurélien Masseboeuf, et al.. Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ TEM biasing. Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩. ⟨hal-01430586v1⟩

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