Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Physics Letters Année : 2015

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Résumé

A dedicated transmission electron microscope sample holder has been used to study in situ the cold-field emission process of carbon cone nanotips (CCnTs). We show that when using a CCnT instead of a Au plate-anode, the standard deviation of the emission current noise can be decreased from the 10 nA range to the 1 nA range under vacuum conditions of 10−5 Pa. This shows the strong influence of the anode on the cold-field emission current noise.
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Dates et versions

hal-01430586 , version 1 (12-02-2018)
hal-01430586 , version 2 (23-02-2018)

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Ludvig de Knoop, Christophe Gatel, Florent Houdellier, Marc Monthioux, Aurélien Masseboeuf, et al.. Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing. Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩. ⟨hal-01430586v2⟩
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