Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

A dedicated transmission electron microscope sample holder has been used to study in situ the cold-field emission process of carbon cone nanotips (CCnTs). We show that when using a CCnT instead of a Au plate-anode, the standard deviation of the emission current noise can be decreased from the 10 nA range to the 1 nA range under vacuum conditions of 10−5 Pa. This shows the strong influence of the anode on the cold-field emission current noise.

Domaines

Instrumentations et Détecteurs [physics.ins-det] Science des matériaux [cond-mat.mtrl-sci]

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1.4923245.pdf (1.19 Mo)

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https://hal.science/hal-01430586

Soumis le : vendredi 23 février 2018-14:05:47

Dernière modification le : mercredi 24 avril 2024-11:28:54

Archivage à long terme le : vendredi 25 mai 2018-04:00:03

Dates et versions

hal-01430586 , version 1 (12-02-2018)

hal-01430586 , version 2 (23-02-2018)

Identifiants

HAL Id : hal-01430586 , version 2
DOI : 10.1063/1.4923245

Citer

Ludvig de Knoop, Christophe Gatel, Florent Houdellier, Marc Monthioux, Aurélien Masseboeuf, et al.. Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing. Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩. ⟨hal-01430586v2⟩

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