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Communication Dans Un Congrès Année : 2012

A Review of Real-Time Soft-Error Rate Measurements in Electronic Circuits

Résumé

The real-time (or life testing) soft-error rate (SER) measurement is an experimental reliability technique to determine the SER from the monitoring of a population of devices subjected to the natural radiation environment and operating under nominal conditions. This review presentation gives a survey over different real-time SER experiments conducted in altitude and/or underground over the past decade. We discuss the specific advantages and limitations of this approach as well as its comparison with accelerated tests using intense particle beams or sources.
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Dates et versions

hal-01430087 , version 1 (09-01-2017)

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Citer

Jean-Luc Autran, Daniela Munteanu, S. Serre, S. Sauze. A Review of Real-Time Soft-Error Rate Measurements in Electronic Circuits. 2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2012, Anaheim, CA, United States. ⟨10.1109/IRPS.2012.6241843⟩. ⟨hal-01430087⟩
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