Helium diffraction on SiC grown graphene: Qualitative and quantitative descriptions with the hard-corrugated-wall model - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2016

Helium diffraction on SiC grown graphene: Qualitative and quantitative descriptions with the hard-corrugated-wall model

Résumé

The Moir\'{e} structure of epitaxial graphene mono layer grown on 6H-SiC(0001) has been investigated recently by grazing incidence fast atom diffraction, and the results were compared with the calculation of the structure \textit{ab initio} and exact diffraction codes. We review these results and present a complementary approach using the Hard Wall Model to extract information without any \textit{a priori}. Reversely, taking advantage of previous exact calculations we evaluate quantitatively the performance of this simplified approach by comparing predictions using the same potential energy surface.
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hal-01417185 , version 1 (12-10-2021)

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Maxime Debiossac, Asier Zugarramurdi, Zhao Mu, Petru Lunca-Popa, Andrew J. Mayne, et al.. Helium diffraction on SiC grown graphene: Qualitative and quantitative descriptions with the hard-corrugated-wall model. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2016, 94 (20), ⟨10.1103/PhysRevB.94.205403⟩. ⟨hal-01417185⟩
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