Improving spatial resolution of immunity maps by post-processing
Résumé
Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.
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Boyer 2016 - NFSI spatial resolution enhancement - final.pdf (284.44 Ko)
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