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Communication Dans Un Congrès Année : 2016

JTAG Combined Attack

Majeric Fabien
Lilian Bossuet
Benoit Gonzalvo
  • Fonction : Auteur

Résumé

The combined attacks are widely spread in the domain of smart cards and microcontrollers but they have not been yet democratized on complex embedded microprocessors such as those which can be found in smart phones, tablets and automotive systems. The main reason behind this is the complexity to inject a fault at the right place and at the right time to make these attacks effective on such devices. However for development and debug, these devices provide new tools that could be considered as potential ways for attacks. It’s the case of the JTAG debug tool which is present on most electronic devices today. The improper use of this latter is already known but in this paper we present a new misuse of this one: the JTAG as a fault injection tool. Through an example, we explain how this tool can be used to perform a combined attack.
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Dates et versions

hal-01382957 , version 1 (17-10-2016)

Identifiants

  • HAL Id : hal-01382957 , version 1

Citer

Majeric Fabien, Lilian Bossuet, Benoit Gonzalvo. JTAG Combined Attack. 8th IFIP International Conference on New technologies, Mobility & Security (NTMS), Nov 2016, Larnaca, Cyprus. ⟨hal-01382957⟩
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