Sin(2) psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure - Archive ouverte HAL Access content directly
Journal Articles Thin Solid Films Year : 2013

Sin(2) psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure

Guillaume Geandier
P. -O. Renault
  • Function : Author
E. Le Bourhis
  • Function : Author

Abstract

Two synchrotron set-ups have been used to carry out in situ strain measurements on systems constituted by Au films on polyimide substrates. These film/substrate composites have been submitted to either uniaxial or equibiaxial loadings. For the two configurations, an area detector (2D) was employed to extract the so-called epsilon-sin(2) psi curves. These latter are shown to be affected by geometrical effect unless equibiaxial loading is employed. Moreover, non-linearity of these curves can occur, even in the case of equibiaxial loading, when the film is thin (120 nm). This last phenomenon is explained by surface anisotropy.
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hal-01293811 , version 1 (25-03-2016)

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D. Faurie, Guillaume Geandier, P. -O. Renault, E. Le Bourhis, D. Thiaudière. Sin(2) psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure. Thin Solid Films, 2013, 530, pp.25-29. ⟨10.1016/j.tsf.2012.02.031⟩. ⟨hal-01293811⟩
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