Structures containing magnetic metallic layers attract a lot of attention because of their possible applications in the area of spintronics. The hybrid structures compatible with the Si crystal lattice parameter are of special interest. In this work the short-period Fe/Si multilayers were grown by the sputtering onto (001)-oriented Si substrate and investigated by various techniques. After the deposition, all multilayers were characterized by atomic force microscopy. The goal of the present paper was to determine the chemical composition of thin layer created at the interface in Fe/Si multilayers due to the Fe diffusion into Si, as well as to analyse the phenomena, which take place in this area. The results of the optical characterization by the Raman scattering were correlated with the magnetic properties of investigated structures (determined by means of the Kerr rotation).