Separation of low- and high-temperature contributions to the exchange bias in Ni81Fe19-NiO thin films - Archive ouverte HAL
Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2013

Separation of low- and high-temperature contributions to the exchange bias in Ni81Fe19-NiO thin films

Résumé

The temperature and time dependence of exchange bias for as-deposited Ni81Fe19-NiO films is studied. Using various cooling and measurement protocols, different contributions to the exchange anisotropy are separated. Depending on the cooling procedure, a strong increase or a controlled reversal of sign of exchange bias field is achieved at lower temperatures far away from the antiferromagnetic blocking temperature. The behavior is explained in terms of antiferromagnetic grain instability and the influence of the interfacial spin structure, the latter freezing at very low temperatures.
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Dates et versions

hal-01276613 , version 1 (19-02-2016)

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J. Mccord, Stéphane Mangin. Separation of low- and high-temperature contributions to the exchange bias in Ni81Fe19-NiO thin films. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2013, 88 (1), ⟨10.1103/PhysRevB.88.014416⟩. ⟨hal-01276613⟩
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