With the emergence of nano-electronic devices, new materials, thin layers and nano structures are developed in order to increase photovoltaic absorbers efficiency, reduce device power consumption, enhance the frequency limit etc. To probe such materials, the characterization techniques are getting more and more demanding, accurate and precise. We present a platform that combines different characterization techniques, to probe locally: structural, optoelectronical, electrical and topographical properties of semiconductors materials. Different spectroscopy techniques: µ-Raman, µ-PL/TRPL, LBIC can be achieved at the same place, coupled with AFM / CP-AFM. In, this talk I will present the capabilities and the limits of the platform through case studies.