Computer-aided reliability-aware approach for analog/mixed integrated circuits and systems
Résumé
The paper introduces the technology scaling induced reliability problems. Based on BSIM4 transistor model, nominal ageing simulation and statistical methods are integrated as an efficient computer-aided approach that applies to reliability analysis of analog/mixed circuits and systems. The ageing varied response surface modeling (RSM) is proposed to represent both ageing and process variations induced degradation. Dynamic comparator is used to verify the proposed method. Furthermore, it is discussed that the proposed method is competent for reliability study in Analog and Mixed-Signal (AMS) circuits and systems.
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