Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir-Blodgett techniques - Archive ouverte HAL
Article Dans Une Revue Optical and Quantum Electronics Année : 2015

Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir-Blodgett techniques

P. N. Hong
  • Fonction : Auteur
P. Benalloul
  • Fonction : Auteur
Z. Guennouni-Assimi
  • Fonction : Auteur
R. Farha
  • Fonction : Auteur
C. Bourdillon
  • Fonction : Auteur
  • PersonId : 1360650
  • IdRef : 067120393
M. -C. Faure
  • Fonction : Auteur
M. Goldmann
W. Marcillac
  • Fonction : Auteur
Laurent Coolen
Agnès Maitre
C. Schwob
  • Fonction : Auteur

Résumé

A silica monolayer has been introduced between tow artificial silica opals using Langmuir Blodgett and inverse Schaefer transfer techniques. The structure and optical properties of the sandwich structure have been characterized by atomic force microscopy, scanning electron microscopy and specular reflection and transmission spectra. The quality of the defect mode inside the stopband made by inverse Schaefer technique is as good as the one obtained by the most commonly used Langmuir-Blodgett technique. Finite difference time domain simulations have been performed and show very good agreement with experimental result.
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Dates et versions

hal-01236747 , version 1 (02-12-2015)

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Citer

P. N. Hong, P. Benalloul, Z. Guennouni-Assimi, R. Farha, C. Bourdillon, et al.. Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir-Blodgett techniques. Optical and Quantum Electronics, 2015, 47 (1, SI), pp.55-65. ⟨10.1007/s11082-014-9939-6⟩. ⟨hal-01236747⟩
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