Overview of light emitting diodes: Reliability estimation from the junction to the packaging - Archive ouverte HAL
Communication Dans Un Congrès Année : 2009

Overview of light emitting diodes: Reliability estimation from the junction to the packaging

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hal-01223382 , version 1 (02-11-2015)

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  • HAL Id : hal-01223382 , version 1

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Yannick Deshayes, Laurent Béchou, Yves Ousten. Overview of light emitting diodes: Reliability estimation from the junction to the packaging. INTERCONEX 2009 - IMAPS FRANCE, Apr 2009, Paris, France. ⟨hal-01223382⟩
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