Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes
Résumé
Highlights
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We observe atypical laser diode (LD) signatures in reverse I-V measurement identified as microplasma discharges.
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Correlation between reverse I-V signatures and LFN measurements appears as a complementary tool for improvement of screening methodology for LD.
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Reverse and forward noise spectra especially exhibit 1/f noise.
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Some lasers reveal g-r noise component in bias voltages corresponding to reverse I-V slope changes and around ITH.
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Presence of g-r noise leads to believe that point defect can be localized near the active zone.