Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends
Résumé
Electromagnetic compatibility (EMC) is an essential requirement to electronic systems in which integrated circuits have a major influence. Intrinsic degradation mechanisms, which produces anticipated wear-out in deep submicron (DSM) components threat not only the reliability of circuits, but also EMC performances. The need to predict and ensure long-term EMC has become a key challenge. This paper aims at presenting the last results on the long-term EMC topic, with a special focus on DSM components. The paper clarifies the effect of device degradation mechanisms on EMC level drifts during lifetime and present some attempts to predict these evolutions.
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