Communication Dans Un Congrès Année : 2015

Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends

Résumé

Electromagnetic compatibility (EMC) is an essential requirement to electronic systems in which integrated circuits have a major influence. Intrinsic degradation mechanisms, which produces anticipated wear-out in deep submicron (DSM) components threat not only the reliability of circuits, but also EMC performances. The need to predict and ensure long-term EMC has become a key challenge. This paper aims at presenting the last results on the long-term EMC topic, with a special focus on DSM components. The paper clarifies the effect of device degradation mechanisms on EMC level drifts during lifetime and present some attempts to predict these evolutions.

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hal-01159227 , version 1 (04-06-2015)

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  • HAL Id : hal-01159227 , version 1

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Alexandre Boyer, Sonia Ben Dhia. Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends. Minapad Forum 2015, Apr 2015, Grenoble, France. 6p. ⟨hal-01159227⟩
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