Electromagnetic compatibility (EMC) is an essential requirement to electronic systems in which integrated circuits have a major influence. Intrinsic degradation mechanisms, which produces anticipated wear-out in deep submicron (DSM) components threat not only the reliability of circuits, but also EMC performances. The need to predict and ensure long-term EMC has become a key challenge. This paper aims at presenting the last results on the long-term EMC topic, with a special focus on DSM components. The paper clarifies the effect of device degradation mechanisms on EMC level drifts during lifetime and present some attempts to predict these evolutions.