Article Dans Une Revue Integrated Ferroelectrics Année : 2014

"Characterization in a Wide Frequency Range (40 MHz - 67 GHz) of a KTa0.65Nb0.35O3 Thin Film for Tunable Applications"

Patrick Queffelec
  • Fonction : Auteur
  • PersonId : 842617

Résumé

A (100) oriented KTa0.65Nb0.35O3 400 nm-thin film has been deposited by Pulsed Laser Deposition on MgO substrate. Microwave measurements, performed on InterDigitated Capacitors, show a paraelectric phase at room temperature with a tunability for the devices of 64% under an electric field of 400 kV/cm. Then, using a specific de-embedding method, the complex permittivity of the KTN thin film has been extracted from 40 MHz up to 67 GHz on coplanar waveguides. As promising applications are pointed out at 60 GHz, such as indoor communications, material characterizations are expected in this spectrum.

Fichier principal
Vignette du fichier
Characterization in a wide frequency.pdf (1019.57 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Licence
Loading...

Dates et versions

hal-01122383 , version 1 (29-05-2015)

Licence

Identifiants

Citer

Grégory Houzet, Thierry Lacrevaz, Cédric Bermond, Bernard Flechet, Arnaud Le Febvrier, et al.. "Characterization in a Wide Frequency Range (40 MHz - 67 GHz) of a KTa0.65Nb0.35O3 Thin Film for Tunable Applications". Integrated Ferroelectrics, 2014, 158 (1), pp. 52-61. ⟨10.1080/10584587.2014.957091⟩. ⟨hal-01122383⟩
560 Consultations
482 Téléchargements

Altmetric

Partager

  • More