Phase evaluation for electronic speckle-pattern interferometry deformation analyses - Archive ouverte HAL Access content directly
Journal Articles Applied optics Year : 1995

Phase evaluation for electronic speckle-pattern interferometry deformation analyses

Abstract

A new, handy method to evaluate phase data from fringe patterns produced by electronic speckle-pattern interferometry is proposed. The method is capable of evaluating phase data by simply taking speckle images and performing arithmetic operations on them. No extra optics or phase modulation is needed. Experiments have been carried out to prove the validity of the principle and demonstrate the capability of applications to practical deformation analyses.
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Dates and versions

hal-01092292 , version 1 (08-12-2014)

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  • HAL Id : hal-01092292 , version 1

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Sanichiro Yoshida, Dr. Suprapedi, Rini Widiastuti, Edi Tri Astuti, Anung Kusnowo. Phase evaluation for electronic speckle-pattern interferometry deformation analyses. Applied optics, 1995, 20 (7), pp.755-757. ⟨hal-01092292⟩
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