The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint
Résumé
This paper proposes a preliminary demonstration of an alternative method of detection of counterfeit integrated devices, based on the " electromagnetic fingerprint " obtained by electromagnetic emission measurements. The principles of the methodology are explained. Two case studies are presented and two data analysis methods are discussed.
Domaines
Electronique| Origine | Fichiers produits par l'(les) auteur(s) |
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