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Article Dans Une Revue Journal of Intelligent Manufacturing Année : 2014

Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

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hal-01063102 , version 1 (11-09-2014)

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M'Hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, 2014, ⟨10.1007/s10845-014-0956-x⟩. ⟨hal-01063102⟩
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