Open-Thru de-embedding for Graphene RF devices
Résumé
The performances of graphene RF devices rely heavily on the precision of the de-embedding techniques adopted, and the small size of the lines increase variability issues in the RF standards and test devices. In this work, a robust and high precision de-embedding technique adapted to the needs of microwave graphene devices is presented. Two standards and only one step after SOLT calibration are needed.
| Origine | Fichiers produits par l'(les) auteur(s) |
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