Electro-optical characterizations for robustness assessment of automotive qualified white LEDs multichip modules: failure analysis and packaging influence - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2013
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hal-01019770 , version 1 (07-07-2014)

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  • HAL Id : hal-01019770 , version 1

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B. Chambion, L. Mendizabal, A. Gasse, L. Bechou, Y. Deshayes, et al.. Electro-optical characterizations for robustness assessment of automotive qualified white LEDs multichip modules: failure analysis and packaging influence. EMPC 2013, Sep 2013, Grenoble, France. pp.Chambion. ⟨hal-01019770⟩
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