Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices - Archive ouverte HAL
Communication Dans Un Congrès Année : 2014
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hal-00987211 , version 1 (05-05-2014)

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  • HAL Id : hal-00987211 , version 1

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Thomas Zimmer, Mario Weiss, Cristell Maneux, Sebastien Fregonese. Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices. SiGe, Ge & Related Compounds: Materials, Processing and Devices, Oct 2014, Mexico. ⟨hal-00987211⟩
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