Interferometric technique for scanning near-field microwave microscopy applications - Archive ouverte HAL
Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2014

Interferometric technique for scanning near-field microwave microscopy applications

Résumé

An interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, an evanescent microwave coaxial probe and a precise interferometer built up with a power divider, a phase-shifter, and an attenuator. Advantages, such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity are achieved. In particular, a scanning near-field microwave microscope is built and experiments related to the measurement sensitivity in the frequency range 2-6 GHz are demonstrated. A lumped element model is also performed to represent the interaction between the probe and sample. A one port calibration model is developed to retrieve the reflection coefficient and then the electromagnetics properties of the sample.
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Dates et versions

hal-00980043 , version 1 (17-04-2014)

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Hind Bakli, Kamel Haddadi, Tuami Lasri. Interferometric technique for scanning near-field microwave microscopy applications. IEEE Transactions on Instrumentation and Measurement, 2014, 63, pp.1281-1286. ⟨10.1109/TIM.2013.2296416⟩. ⟨hal-00980043⟩
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