Muller C-element based Decoder (MCD): A decoder against transient faults
Résumé
This work extends the analysis and application of a digital error correction method called Muller C-element Decoding (MCD), which has been proposed for fault masking in logic circuits comprised of unreliable elements. The proposed technique employs cascaded Muller C-elements and XOR gates to achieve efficient error-correction in the presence of internal upsets. The error-correction analysis of MCD architecture and the investigation of C-element's robustness are first introduced. We demonstrate that the MCD is able to produce error-correction benefit in a high error-rate of internal faults. Significantly, for a (3,6) short-length Low Density Parity Check (LDPC) code, when the decoding process is internally error-free the MCD achieves also a gain in terms of decoding performance by comparison to the well-known Gallager Bit-Flipping method. We further consider application of MCD to a general-purpose fault-tolerant model, coded Dual Modular Redundancy (cDMR), which offers low-redundancy error-resilience for contemporary logic systems as well as future nanoeletronic architectures.
Mots clés
Muller C-element-based decoder
XOR gates
cDMR
coded dual modular redundancy
contemporary logic systems
decoding process
digital error correction method
fault masking
fault-tolerant model
internal upsets
low-redundancy error-resilience
nanoeletronic architectures
short-length LDPC code
short-length low density parity check code
transient faults
Circuit faults
Computer architecture
MCD architecture
Muller C-element decoding
Gallager bit-flipping method
parity check codes
logic circuits
fault tolerance
Decoding
Iterative decoding
Logic gates
Robustness
Domaines
Electronique| Origine | Fichiers produits par l'(les) auteur(s) |
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