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Communication Dans Un Congrès Année : 2013
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hal-00919194 , version 1 (16-12-2013)

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  • HAL Id : hal-00919194 , version 1

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M. Kogelschatz, R. Foissac, S. Blonkowski, P. Delcroix, C. Sire. Dielectric breakdown characteristics studied by scanning probe microscopy under ultrahigh vacuum. Workshop Functional oxides for integration in micro‐ and nano‐electronics, Apr 2013, Autrans, France. ⟨hal-00919194⟩
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