Study of a Cosmic Ray Impact on Combinatorial Logic Circuits of an 8bit SAR ADC in 65nm CMOS Technology - Archive ouverte HAL
Communication Dans Un Congrès Année : 2013

Study of a Cosmic Ray Impact on Combinatorial Logic Circuits of an 8bit SAR ADC in 65nm CMOS Technology

Résumé

This paper presents a sensitivity study to ionizing particles, which are caused by cosmic rays, on a particular combinatorial function of an ST 65nm CMOS technology SAR ADC. A methodology for this study is exposed along with the simulation results. A geometrical visualization of the impacts shows the influence of the impact location effects on the function during operation. An ADC operating cycle analysis is done related to the impacts effects showing combinatorial and memorization errors
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Dates et versions

hal-00868594 , version 1 (01-10-2013)

Identifiants

  • HAL Id : hal-00868594 , version 1

Citer

Daniel Gomez Toro, Fabrice Seguin, Matthieu Arzel, Michel Jezequel. Study of a Cosmic Ray Impact on Combinatorial Logic Circuits of an 8bit SAR ADC in 65nm CMOS Technology. MWSCAS 2013 : IEEE 56th International Midwest Symposium on Circuits and Systems, Jul 2013, Columbus, United States. ⟨hal-00868594⟩
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