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Communication Dans Un Congrès Année : 2010

Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies

Résumé

The use of deeper-submicron technologies in integrated circuits worsens the effects of transient faults. In fact, the transient-fault durations become as important as the clock periods of synchronous circuits. Electronic systems are thus more vulnerable to failure situations. Nevertheless, this paper shows innovatively that such a worse scenario does not happen in asynchronous circuits. This additional novel benefit pushes on the asynchronous design as a better alternative to mitigate transient faults in deep-submicron technology-based circuits.

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Dates et versions

hal-00867836 , version 1 (30-09-2013)

Identifiants

  • HAL Id : hal-00867836 , version 1

Citer

Rodrigo Possamai Bastos, G. Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis. Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2010, Monte Cassino Abbey and Gaeta, Italy. A.p.4. ⟨hal-00867836⟩

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