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Communication Dans Un Congrès Année : 2013

Thermo-mechanical reliability issues in complex microelectronic assemblies: methodological approach

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hal-00853814 , version 1 (23-08-2013)

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  • HAL Id : hal-00853814 , version 1

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Hélène Fremont. Thermo-mechanical reliability issues in complex microelectronic assemblies: methodological approach. SMTA chapter, Jan 2013, United States. ⟨hal-00853814⟩
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