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Journal Articles Key Engineering Materials Year : 2013

Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements

Abstract

This paper describes a new technique allowing the monitoring of damage in metallic freestanding thin films during micro-tensile test by using electrical characterization. After a presentation of the set-up, results obtained on aluminium thin coatings by using two calculation methods for damage variable are presented and commented.
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Dates and versions

hal-00840574 , version 1 (03-07-2013)

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Thibaut Fourcade, Adrien Broué, Jeremie Dehnnin, Jean-Michel Desmarres, Cédric Seguineau, et al.. Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements. Key Engineering Materials, 2013, vol. 550, pp. 157-164. ⟨10.4028/www.scientific.net/KEM.550.157⟩. ⟨hal-00840574⟩
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