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Article Dans Une Revue Strain Année : 2013

Diffusing-wave spectroscopy contribution to strain analysis.

Benjamin Dollet
Jérôme Crassous
Axelle Amon

Résumé

We present a new full-field strain measurement method based on diffusing-wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light-scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10−5-10−3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non-scattering materials.

Dates et versions

hal-00825639 , version 1 (24-05-2013)

Identifiants

Citer

Marion Erpelding, Benjamin Dollet, Alain Faisant, Jérôme Crassous, Axelle Amon. Diffusing-wave spectroscopy contribution to strain analysis.. Strain, 2013, 49 (2), pp.167-174. ⟨10.1111/str.12024⟩. ⟨hal-00825639⟩
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